From e4a195e2b95e4602c667ed19a20f71218df138c2 Mon Sep 17 00:00:00 2001 From: Tushar Vyavahare Date: Tue, 2 Jul 2024 05:59:16 +0000 Subject: selftests/xsk: Enhance batch size support with dynamic configurations Introduce dynamic adjustment capabilities for fill_size and comp_size parameters to support larger batch sizes beyond the previous 2K limit. Update HW_SW_MAX_RING_SIZE test cases to evaluate AF_XDP's robustness by pushing hardware and software ring sizes to their limits. This test ensures AF_XDP's reliability amidst potential producer/consumer throttling due to maximum ring utilization. Signed-off-by: Tushar Vyavahare Signed-off-by: Daniel Borkmann Reviewed-by: Maciej Fijalkowski Link: https://lore.kernel.org/bpf/20240702055916.48071-3-tushar.vyavahare@intel.com --- tools/testing/selftests/bpf/xskxceiver.h | 2 ++ 1 file changed, 2 insertions(+) (limited to 'tools/testing/selftests/bpf/xskxceiver.h') diff --git a/tools/testing/selftests/bpf/xskxceiver.h b/tools/testing/selftests/bpf/xskxceiver.h index 906de5fab7a3..885c948c5d83 100644 --- a/tools/testing/selftests/bpf/xskxceiver.h +++ b/tools/testing/selftests/bpf/xskxceiver.h @@ -80,6 +80,8 @@ struct xsk_umem_info { void *buffer; u32 frame_size; u32 base_addr; + u32 fill_size; + u32 comp_size; bool unaligned_mode; }; -- cgit v1.2.3-58-ga151